Teeft.i
Exploration
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Racine
Exploration
Accueil
Racine

Serveur d'exploration sur les relations entre la France et l'Australie - Exploration (Accueil)

Index « Teeft.i » - entrée « Point defects »
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Point defect structures < Point defects < Point discharge  Facettes :

List of bibliographic references indexed by Point defects

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
004915 (2013) Matthieu Lancry [France] ; Bertrand Poumellec [France] ; John Canning [Australie] ; Kevin Cook [Australie] ; Jean-Claude Poulin [France] ; Francois Brisset [France]Ultrafast nanoporous silica formation driven by femtosecond laser irradiation
005738 (2012) Alberto Zobelli [France] ; Viktoria Ivanovskaya [France] ; Philipp Wagner [France] ; Irene Suarez-Martinez [Australie] ; Abu Yaya [France] ; Chris P. Ewels [France]A comparative study of density functional and density functional tight binding calculations of defects in graphene
006434 (2011) J. C. Reid [Canada, Australie] ; H. Chat ; J. Davidsen [Canada]Filament turbulence in oscillatory media
007E40 (2009) J. S. Williams [Australie] ; G. De M. Azevedo [Australie] ; H. Bernas [France] ; F. Fortuna [France]Ion-Beam-Induced Amorphization and Epitaxial Crystallization of Silicon
00B913 (2001) M. C Ridgway [Australie] ; C. J Glover [Australie] ; I. D Desnica-Frankovic [Croatie] ; K. Furic [Croatie] ; K. M Yu [États-Unis] ; G. J Foran [Australie] ; C. Clerc [France] ; J. L Hansen [Danemark] ; A. Nylandsted Larsen [Danemark]Implantation-induced disorder in amorphous Ge: Production and relaxation
00BA61 (2001) A. Y. Nikulin [Australie] ; K. Siu [Australie] ; J. R. Davis [Australie] ; P. Zaumseil [Allemagne] ; A. Y. Souvorov [France] ; A. Freund [France]Application of the Phase‐Retrieval X‐Ray Diffractometry to an Ultra‐High Spatial Resolution Mapping of SiGe Films near the Absorption Edge of Ge
00BE73 (2000) Paul Raterron [France] ; Prame Chopra [Australie] ; Jean-Claude Doukhan [France]SiO2 precipitation in olivine: ATEM investigation of two dunites annealed at 300 MPa in hydrous conditions
00BE90 (2000) C. J. Glover [Australie] ; M. C. Ridgway [Australie] ; A. P. Byrne [Australie] ; K. M. Yu [États-Unis] ; G. J. Foran [Australie] ; C. Clerc [France] ; J. L Hansen [Danemark] ; A. Nylandsted Larsen [Danemark]Micro- and macro-structure of implantation-induced disorder in Ge
00E053 (1984) L. A. Bursill [Australie] ; Shen Guang Jun [Australie] ; David J. Smith [Royaume-Uni] ; M. G. Blanchin [France]Emergence of small defect contrast within HREM images of nonstoichiometric rutile
00E112 (1982) D. J. Smith [Royaume-Uni] ; M. G. Blanchin [France] ; L. A. Bursill [Australie]High-resolution imaging of reduced rutiles

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